PT  - JOURNAL ARTICLE
AU  - Jurecka, Stanislav
AU  - Mullerova, Jarmila
TI  - Thin Film Optical Parameters Determination by the Dynamical Modelling and Stochastic Optimization Method
DP  - 2006 Mar 31
TA  - Communications - Scientific Letters of the University of Zilina
PG  - 22--24
VI  - 8
IP  - 1
AID - 10.26552/com.C.2006.1.22-24
IS  - 13354205
AB  - We report on a new method of experimental data processing to obtain optical parameters of thin films. Dynamical modelling of the spectral reflectance can be performed interactively in a graphical environment by the genetic search in wide interval of parameter space and then refined by the genetic algorithm method, by the Nelder-Mead downhill simplex method or Marquardt-Levenberg method. Optical parameters of hydrogenated amorphous silicon (a-Si:H) thin film used in solar cell technology are determined by this new method. The spectral reflectance is a function of optical properties and the thickness of the film. Optical parameters found by our approach do not depend on the initial spectral reflectance estimation.