RT Journal Article
SR Electronic
A1 Jurecka, Stanislav
A1 Mullerova, Jarmila
T1 Thin Film Optical Parameters Determination by the Dynamical Modelling and Stochastic Optimization Method
JF Communications - Scientific Letters of the University of Zilina
YR 2006
VO 8
IS 1
SP 22
OP 24
DO 10.26552/com.C.2006.1.22-24
UL https://komunikacie.uniza.sk/artkey/csl-200601-0005.php
AB We report on a new method of experimental data processing to obtain optical parameters of thin films. Dynamical modelling of the spectral reflectance can be performed interactively in a graphical environment by the genetic search in wide interval of parameter space and then refined by the genetic algorithm method, by the Nelder-Mead downhill simplex method or Marquardt-Levenberg method. Optical parameters of hydrogenated amorphous silicon (a-Si:H) thin film used in solar cell technology are determined by this new method. The spectral reflectance is a function of optical properties and the thickness of the film. Optical parameters found by our approach do not depend on the initial spectral reflectance estimation.