Communications - Scientific Letters of the University of Zilina 2006, 8(1):10-12 | DOI: 10.26552/com.C.2006.1.10-12

Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films

Drahoslav Barancok1, Julius Cirak1, Pavol Tomcik1, Jan Vajda1, Martin Weis1
1 Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Summary Well-defined Langmuir-Blodgett films prepared by reproducible technique are still highly attractive for exploitation in investigation of subjects as diverse as chain packing, phase transitions, two-dimensional physics, biosensors and membrane physics. During last 15 years the Maxwell displacement current (MDC) measuring technique was developed for dynamic study of monolayers. In experiment MDC flows through the metal electrode/air gap/Langmuir monolayer/water surface structure. Spontaneous formation of the monolayer was observed and significant differences between destructive and non-destructive processes are discussed.

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Published: March 31, 2006  Show citation

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Barancok, D., Cirak, J., Tomcik, P., Vajda, J., & Weis, M. (2006). Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films. Communications - Scientific Letters of the University of Zilina, 8(1), 10-12. doi: 10.26552/com.C.2006.1.10-12
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