Communications - Scientific Letters of the University of Zilina 2010, 12(2):14-18 | DOI: 10.26552/com.C.2010.2.14-18

Low-Coherence Interferometry for Measurement of Properties of Optical Components

Daniel Kacik1, Norbert Tarjanyi1, Ivan Turek1
1 Department of Physics, Faculty of Electrical Engineering, University of Zilina, Slovakia

We present a modification of the interferometric method for the measurement of refractive index or thickness of optical devices using an easily aligned, almost all-fiber Michelson interferometer. Applicability of the method is demonstrated by the chromatic dispersion measurement of photonic crystal fiber sample. The birefringence of the optical device based on LiNbO3 obtained from the measurement of refractive indices is demonstrated and its value is determined for two different crystal samples. It is also shown that when the thickness of, for example, photopolymer material is known the refractive index of the device can be determined. The described method can be a practical tool for laboratories with the need of inexpensive and easily built setup for measurement of refractive index or thickness of optical devices even in a broad spectral range.

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Published: June 30, 2010  Show citation

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Kacik, D., Tarjanyi, N., & Turek, I. (2010). Low-Coherence Interferometry for Measurement of Properties of Optical Components. Communications - Scientific Letters of the University of Zilina, 12(2), 14-18. doi: 10.26552/com.C.2010.2.14-18
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