Communications - Scientific Letters of the University of Zilina 2023, 25(2):C36-C47 | DOI: 10.26552/com.C.2023.032
Increase of the Automotive Power Transistor Modules Manufacture Reliability Using Ai Detecting System for Soldering Splashes
- 1 Department of Mechatronics and Electronics, Faculty of Electrical Engineering and Information Technologies, University of Zilina, Zilina, Slovakia
- 2 Semikron, s.r.o., Vrbove, Slovakia
- 3 Department of Power Electronics and Machines, Faculty of Electrical Engineering, University of West Bohemia, Pilsen, Czech Republic
This study discusses the automated visual inspection of electronic boards used in the mass production of power electronics equipment. Soldering splashes, produced during the necessary manufacturing stages, can affect the hybrid power semiconductor modules' quality, specifications and lifespan. Splashes from soldering may appear in some electronic boards areas when they may cause decreasing of quality of these boards and need to be removed. Image analysis algorithms are used to search for such areas. The automated inspection is based on neural network YOLO. The images of electronic boards, acquired by authors in SEMIKRON Slovakia company, were used as training, testing and validation dataset for the YOLO network. The custom recording system was designed to acquire those images. The implementation of this method may increase the object search success and then thereby increase the overall quality of module production.
Keywords: transistor, module, solder, splash
Grants and funding:
The results presented in this paper were supported by grant No. APVV 20-0500 - Research of methodologies to increase the quality and lifetime of hybrid power semiconductor modules. This research has also been supported by the Ministry of Education, Youth and Sports of the Czech Republic under the project OP VVV Electrical Engineering Technologies with High-Level of Embedded Intelligence CZ.02.1.01/0.0/0.0/18_069/0009855. Authors want to thank all SEMIKRON Slovakia company staff for cooperation.
Conflicts of interest:
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Received: December 5, 2022; Accepted: January 25, 2023; Prepublished online: March 1, 2023; Published: April 6, 2023 Show citation
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References
- REN, Z., FANG, F., YAN, N., WU, Y. State of the art in defect detection based on machine vision. International Journal of Precision Engineering and Manufacturing-Green Technology [online]. 2022, 9, p. 661-691. ISSN 2288-6206, eISSN 2198-0810. Available from: https://doi.org/10.1007/s40684-021-00343-6
Go to original source...
- ADIBHATLA, V. A., CHIH, H. C., HSU, C. C., CHENG, J., ABBOD, M. F., SHIEH, J. S. Defect detection in printed circuit boards using you-only-look-once convolutional neural networks. Electronics [online]. 2020, 9(9), 1547. eISSN 2079-9292. Available from: https://doi.org/10.3390/electronics9091547
Go to original source...
- REDMON, J., DIVVALA, S., GIRSHICK, R., FARHADI, A. You only look once: unified, real-time object detection. In: IEEE Conference on Computer Vision and Pattern Recognition: proceedings [online]. IEEE. 2016. eISSN 1063-6919, p. 779-788. Available from: https://doi.org/10.1109/CVPR.2016.91
Go to original source...
- HUANG, Y. Q., ZHENG, J. C., SUN, S. D., YANG, C. F., LIU, J. Optimized YOLOv3 algorithm and its application in traffic flow detections. Applied Sciences [online]. 2020, 10(9), 3079. eISSN 2076-3417. Available from: https://doi.org/10.3390/app10093079
Go to original source...
- HUANG, R., GU, J., SUN, X., HOU, Y., UDDIN, S. A rapid recognition method for electronic components based on the improved YOLO-V3 network. Electronics [online]. 2019, 8(8), 825. eISSN 2079-9292. Available from: https://doi.org/10.3390/electronics8080825
Go to original source...
- MALGE, P. S. PCB defect detection, classification and localization using mathematical morphology and image processing tools. International Journal of Computer Applications [online]. 2014, 87, p. 40-45. ISSN 0975-8887. Available from: https://doi.org/10.5120/15240-3782
Go to original source...
- TAKADA, Y., SHIINA, T., USAMI, H., IWAHORI, Y. Defect detection and classification of electronic circuit boards using keypoint extraction and CNN features. In: 9th International Conferences on Pervasive Patterns and Applications Defect PATTERNS 2017: proceedings. 2017. ISBN 978-1-61208-534-0, p. 113-116.
- ANITHA, D. B., MAHESH, R. A survey on defect detection in bare PCB and assembled PCB using image processing techniques. In: 2017 International Conference on Wireless Communications, Signal Processing and Networking WiSPNET: proceedings [online]. IEEE. 2017. ISBN 978-1-5090-4443-6, eISBN 978-1-5090-4442-9, p. 39-43. Available from: https://doi.org/10.1109/WiSPNET.2017.8299715
Go to original source...
- LIAO, X., LV, S., LI, D., LUO, Y., ZHU, Z., JIANG, C. YOLOv4-MN3 for PCB surface defect detection. Applied Sciences [online]. 2021, 11(24), 11701. eISSN 2076-3417. Available from: https://doi.org/10.3390/app112411701
Go to original source...
- MASTERS, D., LUSCHI, C. Revisiting small batch training for deep neural networks. ArXiv [online]. 2018, 1804.07612. eISSN 2331-8422. Available from: https://doi.org/10.48550/arXiv.1804.07612
Go to original source...
- YOLO dataset tiling script [online]. Available from: https://github.com/slanj/yolo-tiling
- Manish Chablani: YOLO - you only look once, real time object detection explained [online]. Available from: https://towardsdatascience.com/yolo-you-only-look-once-real-time-object-detection-explained-492dc9230006
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